Jaemoo Choi

5 Patents

• US126189022026

  Probe Card Including Power Compensation Circuit and Test System Including the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US123284242025

  Interface Board for Testing Image Sensor, Test System Having the Same, and Operating Method Thereof

  Samsung Electronics Co., Ltd.

  0 cites
• US123093532025

  Image Sensor Test System Including Operational Amplifier and Low-frequency Attenuator

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US121051462024

  Wafer-level Multi-device Tester and System Including the Same Preliminary Class

  Samsung Electronics Co., Ltd.

  0 cites
• US120740512024

  Teaching Apparatus and Substrate Alignment Apparatus Using the Same

  Samsung Electronics Co., Ltd.

  0 cites