6 Patents
- US124999612025Built-in-self-test Logic, Memory Device with Same, and Memory Module Testing Method
Samsung Electronics Co., Ltd.
0 cites - USRE0501912024Backlight Unit Having a Lens with Refraction and Reflection Portions
LG ELECTRONICS Inc.
0 cites - 0 cites
- 0 cites
- US118042762023Built-in-self-test Logic, Memory Device with Same, and Memory Module Testing Method
Samsung Electronics Co., Ltd.
0 cites - US115935272023Security Circuit Including Dual Encoder and Endecryptor Including the Security Circuit
SAMSUNG ELECTRONICS CO., Ltd.
0 cites