5 Patents
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- US124300362025Power Loss Protection (PLP) Operation and PLP Module for Electronic Devices
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US121303062024Module Substrate for Semiconductor Module, Semiconductor Module and Test Socket for Testing the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120384732024Test Socket for Performing a Test on an Electronic Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites