Patents/Inventors

Jaeeun Yoon

Yongin-siKR1 patent

2 Patents

US118355792023
Memory Device Detecting Defect by Measuring Line Resistance of Word Line
Samsung Electronics Co., Ltd.
0 cites
US117986452023
Storage Device for Performing Reliability Check by Using Error Correction Code (ECC) Data
Samsung Electronics Co., Ltd.
0 cites