Jae Hoon Joo

4 Patents

• US124695792025

  Semiconductor Test Apparatus Capable of Inducing Reduction of Power Consumption

  YC Corporation

  0 cites
• US124611422025

  Semiconductor Wafer Test System for Controlling Supply of Power to Semiconductor Wafer Test Apparatus and Method of Controlling Supply of Power to Semiconductor Wafer Test Apparatus

  YC Corporation

  0 cites
• US122582822025

  Method for Producing Nickel Sulfate Solution for Secondary Battery from Nickel Cathode

  KEMCO

  0 cites
• US119268822024

  Method for Producing Aqueous Solution Containing Nickel or Cobalt

  KEMCO

  0 cites