Patents/Inventors

Jae Baek Hwang

Seongnam-siKR8 patents

7 Patents

US125718152026
Contact Pin and Spring Contact Including the Same
HICON CO., Ltd.
0 cites
US123927982025
Socket Device for Testing ICS
HICON CO., Ltd.
0 cites
US122480012025
Lidless BGA Socket Apparatus for Testing Semiconductor Device
HICON CO., Ltd.
0 cites
US120612122024
Spring Contact and Socket Having Spring Contact Embedded Therein
HICON CO., Ltd.
0 cites
US119826882024
Spring Contact and Test Socket with Same
HICON CO., Ltd.
0 cites
US116687442023
Contact and Socket Device for Burning-in and Testing Semiconductor IC
0 cites
US115612412023
Spring Contact and Test Socket with Same
HICON CO., Ltd.
0 cites