Patents/Inventors

Jacob Pieter Hoogenboom

DelftNL1 patent

2 Patents

USRE0505402025
Method for Inspecting a Sample Using an Assembly Comprising a Scanning Electron Microscope and a Light Microscope
DELMIC IP B.V.
0 cites
US117421732023
Integrated Optical and Charged Particle Inspection Apparatus
DELMIC IP B.V.
0 cites