2 Patents
- US119713022024System for the Real-time High Precision Measurement of the Atmospheric Attenuation of Electromagnetic Radiation from at Least One Source and Method for Measurement
FUNDACIÓN CENER-CIEMAT
0 cites - US119532362024Characterization Device for Characterizing the Quality of Light Beams Reflected from a Surface of a Reflective Element and Method Therefor
FUNDACIÓN CENER-CIEMAT
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