3 Patents
- US124566002025Scanning Electron Microscopy-based Tomography of Specimens
Applied Materials Israel Ltd.
0 cites - US122780852025Hybrid Scanning Electron Microscopy and Acousto-optic Based Metrology
APPLIED MATERIALS ISRAEL Ltd.
0 cites - US118165582023Integrated Circuit Designs for Reservoir Computing and Machine Learning
UNIVERSITY OF MARYLAND, COLLEGE PARK
0 cites