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Inventors
Irad Peleg
Tel Aviv
IL
3 patents
3 Patents
US12131458
2024
Determination of a Simulated Image of a Specimen
Applied Materials Israel Ltd.
0 cites
US11790515
2023
Detecting Defects in Semiconductor Specimens Using Weak Labeling
Applied Materials Israel Ltd.
0 cites
US11562476
2023
Determination of a Simulated Image of a Specimen
Applied Materials Israel Ltd.
0 cites