Patents/Inventors

Inkeun Baek

Suwon-siKR6 patents

9 Patents

US124742602025
Terahertz Signal Measuring Apparatus and Measuring Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124743932025
Terahertz Probe
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124697502025
Method of Extracting Properties of a Layer on a Wafer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US121966692025
Inspection Apparatus and Method of Inspecting Wafer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US121659332024
Semiconductor Substrate Processing Apparatus and Semiconductor Substrate Measuring Apparatus Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119468812024
Inspection Apparatus and Inspection Method Using Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US116808982023
Hybrid Probe, Physical Property Analysis Apparatus Including the Same, and Method of Measuring Semiconductor Device Using the Apparatus
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US115791672023
Probe for Detecting Near Field and Near-field Detection System Including the Same
Samsung Electronics Co., Ltd.
0 cites
US115791682023
Probe for Detecting Near Field and Near-field Detecting System Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites