Patents/Inventors

Ingi Kim

Suwon-siKR13 patents

11 Patents

US125817972026
Electronic Device Comprising Transparent Cover Including Glass and Foldable Display Coupled Thereto
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US125387582026
Substrate Inspection System and Method of Manufacturing Semiconductor Device Using Substrate Inspection System
Samsung Electronics Co., Ltd.
0 cites
US125104912025
Apparatus for Inspecting Surface of Object
Samsung Electronics Co., Ltd.
0 cites
US124742602025
Terahertz Signal Measuring Apparatus and Measuring Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124697502025
Method of Extracting Properties of a Layer on a Wafer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124396072025
Inspection Device
Samsung Electronics Co., Ltd.
0 cites
US123392232025
Measuring Apparatus and Testing Apparatus Having the Same
Samsung Electronics Co., Ltd.
0 cites
US123275792025
Inspection Device
Samsung Electronics Co., Ltd.
0 cites
US119468092024
Polarization Measuring Device and Method of Fabricating Semiconductor Device Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US118239272023
Wafer Inspection Apparatus and System Including the Same
Samsung Electronics Co., Ltd.
0 cites
US118239612023
Substrate Inspection System and Method of Manufacturing Semiconductor Device Using Substrate Inspection System
SAMSUNG ELECTRONICS CO., Ltd.
0 cites