4 Patents
- US1227251820253D Metrology from 3D Datacube Created from Stack of Registered Images Obtained During Delayering of the Sample
APPLIED MATERIALS ISRAEL Ltd.
0 cites - US120338312024Analyzing a Sidewall of Hole Milled in a Sample to Determine Thickness of a Buried Layer
Applied Materials Israel Ltd.
0 cites - US1172812620233D Metrology from 3D Datacube Created from Stack of Registered Images Obtained During Delayering of the Sample
Applied Materials Israel Ltd.
0 cites - US116258202023Evaluating an Inspection Algorithm for Inspecting a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites