Ilan Ben-harush

4 Patents

• US123477342025

  Examination of a Hole Formed in a Semiconductor Specimen

  Applied Materials Israel Ltd.

  0 cites
• US122998682025

  Control of a Manufacturing Process Using Contour Curvature Analysis of Specimens

  Applied Materials Israel Ltd.

  0 cites
• US122720422025

  Detection of Defects Using a Computationally Efficient Segmentation Approach

  Applied Materials Israel Ltd.

  0 cites
• US116865712023

  Local Shape Deviation in a Semiconductor Specimen

  Applied Materials Israel Ltd.

  0 cites