Patents/Inventors

Ikseon Jeon

Suwon-siKR3 patents

5 Patents

US124742602025
Terahertz Signal Measuring Apparatus and Measuring Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124743932025
Terahertz Probe
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124697502025
Method of Extracting Properties of a Layer on a Wafer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119468812024
Inspection Apparatus and Inspection Method Using Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US115791682023
Probe for Detecting Near Field and Near-field Detecting System Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites