Patents/Inventors

Ikeda Hiroki

San Jose, CAUS20 patents

15 Patents

US126188962026
Active Thermal Interposer Device with Thermal Isolation Structures
Advantest Test Solutions, Inc.
0 cites
US126132732026
Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites
US125409672026
Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc
0 cites
US125409682026
Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites
US125355222026
Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites
US123208412025
Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites
US122353142025
Parallel Test Cell with Self Actuated Sockets
Advantest Test Solutions, Inc
0 cites
US122161542025
Active Thermal Interposer Device
Advantest Test Solutions, Inc.
0 cites
US119404872024
Thermal Solution for Massively Parallel Testing
Advantest Test Solutions, Inc.
0 cites
US118466692023
Active Thermal Interposer Device
Advantest Test Solutions, Inc.
0 cites
US117744922023
Test System Including Active Thermal Interposer Device
Advantest Test Solutions, Inc.
0 cites
US117546202023
DUT Placement and Handling for Active Thermal Interposer Device
Advantest Test Solutions, Inc.
0 cites
US116749992023
Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites
US116092662023
Active Thermal Interposer Device
Advantest Test Solutions, Inc.
0 cites
US115671192023
Testing System Including Active Thermal Interposer Device
Advantest Test Solutions, Inc.
0 cites