Patents/Inventors

Ido Almog

RehovotIL6 patents

7 Patents

US122780852025
Hybrid Scanning Electron Microscopy and Acousto-optic Based Metrology
APPLIED MATERIALS ISRAEL Ltd.
0 cites
US118599632024
Depth Profiling of Semiconductor Structures Using Picosecond Ultrasonics
Applied Materials Israel Ltd
0 cites
US118154702023
Multi-perspective Wafer Analysis
Applied Materials Israel, Ltd.
0 cites
US118039612023
Die-to-multi-die Wafer Inspection
Applied Materials Israel Ltd.
0 cites
US117139642023
Cathodoluminescence Focal Scans to Characterize 3D NAND CH Profile
Applied Materials Israel Ltd.
0 cites
US116880552023
Methods and Systems for Analysis of Wafer Scan Data
Applied Materials Israel Ltd.
0 cites
US116623242023
Three-dimensional Surface Metrology of Wafers
Applied Materials Israel Ltd.
0 cites