I-shih Tseng

6 Patents

• US125105632025

  Pogo Pin Cooling System and Electronic Device Testing Apparatus Having the System

  CHROMA ATE Inc.

  0 cites
• US123859472025

  Direct Liquid Cooling System for Electronic Devices in Sockets, Method, and Electronic Device Testing Apparatus Comprising the Same

  CHROMA ATE Inc.

  0 cites
• US123457412025

  Wafer Inspection Method and Inspection Apparatus

  CHROMA ATE Inc.

  0 cites
• US122535412025

  Pogo Pin Cooling System and Method and Electronic Device Testing Apparatus Having the System

  CHROMA ATE Inc.

  0 cites
• US121968062025

  Aging Test System and Aging Test Method for Thermal Interface Material and Electronic Device Testing Apparatus Having the System

  CHROMA ATE Inc.

  0 cites
• US118413812023

  Wafer Inspection Method and Inspection Apparatus

  CHROMA ATE Inc.

  0 cites