I-ching Li

8 Patents

• US125946302026

  Amorphous Phase Modification Apparatus and Processing Method of Single Crystal Material

  Mradian Femto Sources Co., Ltd.

  0 cites
• US120766772024

  Method for Collecting Dust from Single Crystal Growth System

  GLOBALWAFERS CO., Ltd.

  0 cites
• US120446312024

  Wafer Surface Defect Inspection Method and Apparatus Thereof

  Globalwafers Co., Ltd.

  0 cites
• US119234222024

  Semiconductor Device

  Globalwafers Co., Ltd.

  0 cites
• US118599652024

  Material Analysis Method

  Globalwafers Co., Ltd.

  0 cites
• US118524652023

  Wafer Inspection Method and Apparatus Thereof

  Globalwafers Co., Ltd.

  0 cites
• US118450302023

  Method for Collecting Dust from Single Crystal Growth System and Dust Collecting System Thereof

  Globalwafers Co., Ltd.

  0 cites
• US117086422023

  Mono-crystalline Silicon Growth Apparatus

  Globalwafers Co., Ltd.

  0 cites