8 Patents
- US123212902025Memory Device Supporting a High-efficient Input/output Interface and a Memory System Including the Memory Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120615612024Memory Device Supporting a High-efficient Input/output Interface and a Memory System Including the Memory Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US118705042024Translation Device, Test System Including the Same, and Memory System Including the Translation Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US117898792023Memory Device Supporting a High-efficient Input/output Interface and a Memory System Including the Memory Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US116930302023Probe Device, Test Device, and Test Method for Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US116694482023Transmitters for Generating Multi-level Signals and Memory System Including the Same
Samsung Electronics Co., Ltd.
0 cites - US115942672023Memory Device for Receiving One Clock Signal as a Multi-level Signal and Restoring Original Data Encoded Into the Clock Signal and Method of Operating the Same
Samsung Electronics Co., Ltd.
0 cites - US115819602023Translation Device, Test System Including the Same, and Memory System Including the Translation Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites