Hyukje Kwon

3 Patents

• US125074162025

  Memory Device Including Memory Blocks Different from Each Other

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US117155252023

  Erase Method of Nonvolatile Memory Device, and Operation Method of Storage Device

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US115689492023

  Semiconductor Package Test Method, Semiconductor Package Test Device and Semiconductor Package

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites