4 Patents
- US126074592026Real-time Three-dimensional Shape Measurement System and Shape Measurement Method Using Diagonal Line Pattern Irradiation Method
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
0 cites - US124741652025Calibration Method for Deflectometry Method, for Improving Measurement Accuracy
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
0 cites - US123264022025Vibration Insensitive Interferometry for Measuring Thickness and Profile of Multilayer Thin-film
Korean Research Institute Of Standard And Science
0 cites - US119062812024Device and Method for Measuring Thickness and Refractive Index of Multilayer Thin Film by Using Angle-resolved Spectral Reflectometry
Korea Research Institute Of Standards And Science
0 cites