Patents/Inventors

Hyo Sang Jo

Uiwang-siKR1 patent

2 Patents

US124695792025
Semiconductor Test Apparatus Capable of Inducing Reduction of Power Consumption
YC Corporation
0 cites
US124611422025
Semiconductor Wafer Test System for Controlling Supply of Power to Semiconductor Wafer Test Apparatus and Method of Controlling Supply of Power to Semiconductor Wafer Test Apparatus
YC Corporation
0 cites