24 Patents
- US125819252026Selective Metal Cap in an Interconnect Structure
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US125576292026Interconnect Structure and Methods of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US124697452025Conductive Structures with Bottom-less Barriers and Liners
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US123343972025Interconnect Structure Including Graphite and Method Forming Same
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US123226492025Interconnect Structure of Semiconductor Device
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - 0 cites
- US122372612025Semiconductor Device Having a Contact Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US121659752024Method of Forming Interconnect Structure Having a Barrier Layer
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - 0 cites
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- US121598382024Method of Forming an Interconnect Structure Having an Air Gap and Structure Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US120947702024Ruthenium-based Liner for a Copper Interconnect
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US120805942024Thermally Stable Copper-alloy Adhesion Layer for Metal Interconnect Structures and Methods for Forming the Same
Taiwan Semiconductor Manufacturing Company Limited
0 cites - 0 cites
- US119086972024Interconnect Structure Having a Carbon-containing Barrier Layer
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
0 cites - US118517492023Semiconductor Device, Method and Machine of Manufacture
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US118307422023Selective Capping Processes and Structures Formed Thereby
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - 0 cites
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- US117422902023Interconnect Structure and Method of Forming Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US116826242023Method of Forming an Interconnect Structure Having an Air Gap and Structure Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US116768982023Diffusion Barrier for Semiconductor Device and Method
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US116520442023Contact Structure and Method of Making
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites