Patents/Inventors

Huiping Huang

San Jose, CAUS3 patents

3 Patents

US125305152026
Maximizing Detectable Defect Coverage of Analog Circuits in Integrated Circuit Design
Synopsys, Inc.
0 cites
US123323012025
Measuring Device Defect Sensitization in Transistor-level Circuits
Synopsys, Inc.
0 cites
US115799942023
Fast and Scalable Methodology for Analog Defect Detectability Analysis
Synopsys, Inc.
0 cites