Hubert Martin Bode

5 Patents

• US126222292026

  Structure and Method for Test-point Access in a Semiconductor

  NXP USA, Inc.

  0 cites
• US124616222025

  Test Methods for Capacitive Touch Screens, and Capacitive Touch Screen Assemblies

  NXP B.V.

  0 cites
• US124628502025

  System and Method for Improving Safety of Integrated Circuits

  NXP B.V.

  0 cites
• US123224722025

  Voltage Generation Circuit for SRAM

  NXP B.V.

  0 cites
• US119776642024

  Supply Voltage Proportionality Monitoring in a System-on-chip (SOC)

  NXP USA, Inc.

  0 cites