6 Patents
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- US123548712025Ultrathin Atomic Layer Deposition Film Accuracy Thickness Control
Lam Research Corporation
0 cites - US122610382025Gapfill of Variable Aspect Ratio Features with a Composite PEALD and PECVD Method
Lam Research Corporation
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- US116461982023Ultrathin Atomic Layer Deposition Film Accuracy Thickness Control
Lam Research Corporation
0 cites