Hsuan-fu Wang

4 Patents

• US122534742025

  Detection Method and System for Determining the Location of a Surface Defect on a Front or Back Surface of a Transparent Film

  HUA YANG Precision Machinery Co., Ltd

  0 cites
• US122418442025

  Method and System for Detecting a Defect on a Semi-reflective Film by Illuminating Different Light Sources Along the Same Optical Axis

  HUA YANG Precision Machinery Co., Ltd

  0 cites
• US119617162024

  Atomic Layer Deposition Method

  Industrial Technology Research Institute

  0 cites
• US118506062023

  Particles Capturing System

  INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

  0 cites