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Inventors
Hsiu Chi Liang
Hsinchu
TW
1 patent
2 Patents
US12482677
2025
Wafer Processing Apparatus Including Rotatable Element Connected to Pressure Applying Element
Globalwafers Co., Ltd.
0 cites
US12203871
2025
Ingot Evaluation Method and Detecting Apparatus
Globalwafers Co., Ltd.
0 cites