4 Patents
- US125117732025Wafer Image Denoising and Contour Extraction for Manufacturing Process Calibration
Siemens Industry Software Inc.
0 cites - US124820902025Wafer Image Defect Detection and Characterization for Manufacturing Process Calibration
Siemens Industry Software Inc.
0 cites - US124675922025Light String and Ornamental Article Including the Same
MARVELLOUS DAY INDUSTRIAL INTERNATIONAL LIMITED
0 cites - US118993672024Dummy Insertion for Improving Throughput of Electron Beam Lithography
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd
0 cites