9 Patents
- US125751722026Metal Gate Electrode Formation of Memory Devices
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US124842742025Techniques for Semiconductor Gate and Contact Formation to Reduce Seam Formation
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US124647732025Formation of a Semiconductor Device with a Gate Containing a Metal Oxide Layer Using an Oxidation Process
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122551042025Semiconductor Device and Method of Manufacture
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US121836382024In-situ Formation of Metal Gate Modulators
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US121549642024Metal Gates with Layers for Transistor Threshold Voltage Tuning and Methods of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US120876372024Semiconductor Device and Method of Manufacture
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US120402352024Semiconductor Device and Method of Manufacture
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US118429282023In-situ Formation of Metal Gate Modulators
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites