Hsin-chih Wang

2 Patents

• US125637772026

  Complementary Field Effect Transistor with Oblique Conductive Through Substrate Layer

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US124761502025

  Critical Dimension Uniformity (CDU) Control Method and Semiconductor Substrate Processing System

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites