Hongqiang Ma

2 Patents

• US125672682026

  Automated Nanoscopy System Having Integrated Artifact Minimization Modules, Including Embedded Nanometer Position Tracking Based on Phasor Analysis

  University Of Pittsburgh—of The Commonwealth System Of Higher Education

  0 cites
• US120446252024

  Systems and Methods for Robust Background Correction And/or Emitter Localization for Super-resolution Localization Microscopy

  University Of Pittsburgh—of The Commonwealth System Of Higher Education

  0 cites