Hongkun Liang

2 Patents

• US122657762025

  Identifying Test Coverage Gaps for Integrated Circuit Designs Based on Node Testability and Physical Design Data

  NXP USA, Inc.

  0 cites
• US120356862024

  Method of Operating a Latching Mechanism for Pet Enclosure

  PLUTO OPCO (CAYMAN), LLC

  0 cites