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Inventors
Holger Seitz
Jena
DE
2 patents
2 Patents
US11867642
2024
Inspection Device for Masks for Semiconductor Lithography and Method
Carl Zeiss SMT GmbH
0 cites
US11619882
2023
Method and Apparatus for Characterizing a Microlithographic Mask
Carl Zeiss SMT GmbH
0 cites