6 Patents
- US125539442026Built-in Self Test Circuit for Measuring Performance of Clock Data Recovery and System-on-chip Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US124894822025Continuous Time Linear Equalizer and Device Including the Same
Samsung Electronics Co., Ltd.
0 cites - US117574372023Monotonic and Glitch-free Phase Interpolator and Communication Device Including the Same
Samsung Electronics Co., Ltd.
0 cites - US117402702023Pattern Generator and Built-in-self Test Device Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US117000122023Digital-to-analog Conversion Circuit and Receiver Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites