Ho-yin Chen

3 Patents

• US126082712026

  Memory with Electrically Programmable Fuses and Related Tester

  Etron Technology, Inc.

  0 cites
• US122247682025

  Error Correction Method, Error Correction Circuit and Electronic Device Applying the Same

  ETRON TECHNOLOGY, Inc.

  0 cites
• US117361212023

  Error Correction Method, Error Correction Circuit and Electronic Device Applying the Same

  ETRON TECHNOLOGY, Inc.

  0 cites