Ho Geun Park

3 Patents

• US122276452025

  Polyamide Resin Composition and Molded Product Comprising Same

  Lotte Chemical Corporation

  0 cites
• US118165792023

  Method and Apparatus for Detecting Defect Pattern on Wafer Based on Unsupervised Learning

  SAMSUNG SDS CO., Ltd.

  0 cites
• US115872222023

  Method and Apparatus for Detecting Defect Pattern on Wafer Based on Unsupervised Learning

  SAMSUNG SDS CO., Ltd.

  0 cites