Patents/Inventors

Hiroyuki Shindo

TokyoJP6 patents

7 Patents

US124741662025
Pattern Inspection/measurement Device, and Pattern Inspection/measurement Program
Hitachi High-tech Corporation
0 cites
US123940382025
Image Processing Program, Image Processing Device, and Image Processing Method
Hitachi High-tech Corporation
0 cites
US122111942025
Defect Inspection with Images of Different Synthesis Ratios
Hitachi High-tech Corporation
0 cites
US121251762024
Inspection Apparatus and Measurement Apparatus
HITACHI HIGH-TECH CORPORATION
0 cites
US120145302024
Image Recognition Device and Method
HITACHI HIGH-TECH CORPORATION
0 cites
US118369062023
Image Processing System and Computer Program for Performing Image Processing
HITACHI HIGH-TECH CORPORATION
0 cites
US115872252023
Pattern Inspection System
HITACHI HIGH-TECH CORPORATION
0 cites