Hiroyuki Ikeda

3 Patents

• US125420122026

  Test System, Control Device, Test Method, and Test System Program

  HORIBA, Ltd.

  0 cites
• US124929432025

  Generation Device, Generation System, Processing System, Generation Method, and Storage Medium

  Toshiba Carrier Corporation

  0 cites
• US119282912024

  Image Projection Device

  0 cites