5 Patents
- US125730182026Defect Analysis Device, Defect Analysis Method, Non-transitory Computer-readable Medium, and Learning Device
MITSUBISHI HEAVY INDUSTRIES, Ltd.
0 cites - US122038962025Ultrasonic Testing Device, Method, Program, and Ultrasonic Testing System
MITSUBISHI HEAVY INDUSTRIES, Ltd.
0 cites - US121468632024Ultrasonic Flaw Detection Device and Method for Controlling Same
MITSUBISHI HEAVY INDUSTRIES MACHINERY SYSTEMS, Ltd.
0 cites - US119352822024Server of Crop Growth Stage Determination System, Growth Stage Determination Method, and Storage Medium Storing Program
NTT DATA CCS CORPORATION
0 cites - US119275692024Ultrasonic Flaw Detection Device, Ultrasonic Flaw Detection Method, and Ultrasonic Flaw Detection Program
MITSUBISHI HEAVY INDUSTRIES, Ltd.
0 cites