8 Patents
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- US125538112026Attenuated Total Reflectance Spectroscopy Apparatus, and Attenuated Total Reflectance Spectroscopy Method
HAMAMATSU PHOTONICS K.K.
0 cites - US124428092025Hygroscopicity Evaluation Method and Water Content Evaluation Method
HAMAMATSU PHOTONICS K.K.
0 cites - US123927202025Time Response Measurement Apparatus and Time Response Measurement Method
HAMAMATSU PHOTONICS K.K.
0 cites - US123724582025Optical Property Measurement Apparatus and Optical Property Measurement Method
HAMAMATSU PHOTONICS K.K.
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- US122593212025Method for Removing Background of Fluorescence Lifetime Measurement and Method for Quantifying Target Substance
HAMAMATSU PHOTONICS K.K.
0 cites - US117743572023Terahertz Wave Attenuated Total Reflection Spectroscopic Method, Terahertz Wave Attenuated Total Reflection Spectroscopic Device, and Pressure Application Device
HAMAMATSU PHOTONICS K.K.
0 cites