Patents/Inventors

Hiroshi Oinuma

TokyoJP3 patents

3 Patents

US121988942025
Measurement System and Method of Setting Parameter of Charged Particle Beam Device
Hitachi High-tech Corporation
0 cites
US118989742024
Charged Particle Beam Device, Computer, and Signal Processing Method for Charged Particle Beam Device
HITACHI HIGH-TECH CORPORATION
0 cites
US118481712023
Charged Particle Beam Device and Charged Particle Beam Device Calibration Method
HITACHI HIGH-TECH CORPORATION
0 cites