15 Patents
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- US124223802025Measurement Method, Measurement System, and Non-transitory Computer Readable Medium
Hitachi High-tech Corporation
0 cites - US121970512025Optical Inspection Circuit and Optical Inspection Method
NIPPON TELEGRAPH AND TELEPHONE CORPORATION
0 cites - US121112722024System for Estimating the Occurrence of Defects, and Computer-readable Medium
Hitachi High-tech Corporation
0 cites - US120666652024Optical Circuit for Alignment and Optical Alignment Method
Nippon Telegraph And Telephone Corporation
0 cites - US120557732024Aligning Optical Circuit and Aligning Method
Nippon Telegraph And Telephone Corporation
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- US119410982024Authentication Device, Authentication System, Authentication Method, and Program
NEC CORPORATION
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- US117472912023System for Estimating the Occurrence of Defects, and Computer-readable Medium
Hitachi High-tech Corporation
0 cites - 0 cites