Hironori Katsumi

3 Patents

• US118466322023

  Sample Measurement Device and Sample Measurement Method

  SYSMEX CORPORATION

  0 cites
• US117965502023

  Sample Analyzer, Sample Analyzing Method, and Reagent Container Holder

  SYSMEX CORPORATION

  0 cites
• US116809512023

  Sample Analyzer and Sample Analyzing Method

  SYSMEX CORPORATION

  0 cites