Patents/Inventors

Hiromu Inoue

YokohamaJP2 patents

2 Patents

US125796352026
Pattern Inspection Apparatus and Pattern Inspection Method Inspecting a Pattern Using an Image Corrected Using Offset Amount Based Upon Dark Noise Levels
Nuflare Technology, Inc.
0 cites
US122052722025
Pattern Inspection Device and Pattern Inspection Method
Nuflare Technology, Inc.
0 cites