6 Patents
- US122153082025Charged Particle Beam Apparatus and Cell Evaluation Method
Hitachi High-tech Corporation
0 cites - US121701842024Transmission Electron Microscope and Inspection Method Using Transmission Electron Microscope
Hitachi High-tech Corporation
0 cites - 0 cites
- US117911312023Charged Particle Beam Apparatus and Method for Controlling Charged Particle Beam Apparatus
Hitachi High-tech Corporation
0 cites - US117567642023Charged Particle Beam Apparatus and Method of Controlling Charged Particle Beam Apparatus
HITACHI HIGH-TECH CORPORATION
0 cites - 0 cites