Hiroki Hosaka

3 Patents

• US121069972024

  Test Device, Change Kit, and Method of Exchanging Change Kit

  Tokyo Electron Limited

  0 cites
• US120339452024

  Microelectronic Device Interface Configurations, and Associated Methods, Devices, and Systems

  Micron Technology, Inc.

  0 cites
• US116409692023

  Compensation Capacitors Layout in Semiconductor Device

  Micron Technology, Inc.

  0 cites