Hirokazu Seki

6 Patents

• US123615362025

  EUV Mask Inspection Device, EUV Mask Inspection Method, Non-transitory Computer-readable Medium Storing EUV Mask Inspection Program, and EUV Mask Inspection System Including a Gray Image Based on Design Data of a Pattern

  LASERTEC CORPORATION

  0 cites
• US123530992025

  Display Device

  Japan Display Inc.

  0 cites
• US120403382024

  Imaging Apparatus

  SONY SEMICONDUCTOR SOLUTIONS CORPORATION

  0 cites
• US120227052024

  Display Device

  Japan Display Inc.

  0 cites
• US117853212023

  Imaging Device

  SONY SEMICONDUCTOR SOLUTIONS CORPORATION

  0 cites
• US117514522023

  Display Device

  Japan Display Inc.

  0 cites