Patents/Inventors

Hind Kraytem

LondonGB4 patents

4 Patents

US118929012024
Data Analysis System to Facilitate Investigative Process
Palantir Technologies Inc.
0 cites
US117899312023
User-interactive Defect Analysis for Root Cause
Palantir Technologies Inc.
0 cites
US117554542023
Defect Resolution
Palantir Technologies Inc.
0 cites
US116452502023
Detection and Enrichment of Missing Data or Metadata for Large Data Sets
Palantir Technologies Inc.
0 cites